|
Volumn 3, Issue 2, 2006, Pages 275-278
|
Spreading resistance microscopy study of polyamidine thin films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
SUBSTRATES;
SURFACE PROPERTIES;
THIN FILMS;
LOW ELECTRICAL FIELD STRENGTH;
POLYMER SURFACE;
RESISTANCE MICROSCOPY;
RESISTANCE MODE;
NITROGEN COMPOUNDS;
THIN FILMS;
ATOMIC FORCE MICROSCOPE (AFM);
CRITICAL DENSITY;
HIGH CONDUCTIVITY;
LOW ELECTRICAL FIELD;
POLYMER SURFACES;
SPREADING RESISTANCE;
|
EID: 32944462516
PISSN: 16101634
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1002/pssc.200562727 Document Type: Conference Paper |
Times cited : (9)
|
References (14)
|