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Volumn 3, Issue 2, 2006, Pages 275-278

Spreading resistance microscopy study of polyamidine thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; SUBSTRATES; SURFACE PROPERTIES; THIN FILMS;

EID: 32944462516     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200562727     Document Type: Conference Paper
Times cited : (9)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.