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Volumn , Issue , 2005, Pages 319-320
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Experimental observation of fractal-regular surfaces and a transformation scheme for extracting fractal parameters
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
MAGNETIC FIELDS;
SILICON WAFERS;
SURFACE PROPERTIES;
FRACTAL PARAMETERS;
POWER SPECTRAL DENSITY;
FRACTALS;
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EID: 32844459302
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1115/wtc2005-63585 Document Type: Conference Paper |
Times cited : (4)
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References (6)
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