Silicon photon-counting detectors enable nextgeneration imaging

Laser Focus World

Volumn 42, Issue 1, 2006, Pages 133-136

  O'Keeffe, Joe ^a   Jackson, Carl ^a  

^a ON SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FLUORESCENCE; PARTICLE DETECTORS; PARTICLE SIZE ANALYSIS; PHOTONS; SILICON; TOMOGRAPHY;

COUNTING DETECTORS; NEXTGENERATION IMAGING; PHOTON-ARRIVAL; SILICON PHOTON;

HIGH ENERGY PHYSICS;

EID: 32844457068     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review

References (5)

1. D.M. Taylor et al., J. Modem Optics 57(9-10) (June-July 2004).
2. J.C. Jackson et al., Appl. Phys. Lett 80(22) (June, 2002).
3. J. Kruger et al., J. Micromechanics and Micro-engineering 12 (July 2002).
4. J.C. Jackson et al., Proc. SPIE 2005, Semiconductor Photodetectors II, 5726-11 (January 2005).
5. A.M. Moloney et al., Electronics Lett. 39(4) (February 2003).