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Volumn 29, Issue 1, 2006, Pages 31-38

Reliable eye-diagram analysis of data links via device macromodels

Author keywords

Circuit modeling; Digital integrated circuits; Electromagnetic compatibility; Macromodeling; Signal integrity; Sytem identification

Indexed keywords

COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTROMAGNETIC COMPATIBILITY; EQUIVALENT CIRCUITS; RELIABILITY;

EID: 32444449393     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2005.862645     Document Type: Article
Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.