On-line measurement of deposit dimension in spray forming using image processing technology

Journal of Materials Processing Technology

Volumn 172, Issue 2, 2006, Pages 195-201

  Qu, Ying Dong ^a   Cui, Cheng Song ^a   Chen, Shan Ben ^b   Li, Qing Chun ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Deposit dimension; Image processing; On line measurement; Spray forming

Indexed keywords

ADAPTIVE SYSTEMS; ERROR ANALYSIS; IMAGE PROCESSING; NOISE ABATEMENT; ONLINE SYSTEMS;

DEPOSIT DIMENSION; ON-LINE MEASUREMENT; SPRAY FORMING;

SPRAYING;

EID: 32444448140     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2005.10.004     Document Type: Article

References (12)

1. P.S. Grant Spray forming Prog. Mater. Sci. 39 1995 497
2. Q. Xu, and E.J. Lavernia Fundamentals of the spray forming process Proceedings of 2000 International Conference on Spray Deposition and Melt Atomization Bremen, Germany 2000 17
3. P.S. Grant, and B. Cantor Infrared thermal imaging measurement of deposit surface temperatures during spray deposit Powder Metall. 33 1990 144
4. R.S. Miller, S.A. Miller, S.D. Savkar, and D.P. Mourer Near infrared measurements in close-coupled gas atomization Int. J. Powder Metall. 32 1996 165
5. D.E. Lawrynowicz, and E.J. Lavernia Sensors and techniques used to monitor processing parameters during spray atomization and deposition J. Mater. Sci. 30 1995 1125
6. D. Marr, and E.C. Hildreth Theory of edge detection Proc. R. Soc. 207B 1980 187
7. J. Canny A computational approach to edge detection IEEE Trans. Pattern Anal. Mach. Intell. 8 1986 679
8. X.Q. Yang, and M. Li Using Hopfield neural network and 2D evolutionary operators to detect image edge Proc. SPIE - Int. Soc. Opt. Eng. 4221 2002 292
9. X.W. Kong, C. Xie, and W.R. Xu Edge detection using multiple edge features and fuzzy reasoning, Tien Tzu Hsueh Pao Acta Electron. Sinica 2002 36
10. M.H. Hueckel An operator which locate edges in digitized pictures J. ACM 18 1971 113
11. P.L. Edward, and M.R. Owen Subpixel measurements using a moment-based-edge operator IEEE Trans. Pattern Anal. Mach. Intell. 11 1989 1293
12. S. Ghosal, and R. Ehrotra Orthogonal moment operators for subpixel edge detection Pattern Recognit. 26 1993 295