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Volumn 52, Issue 1-2, 1999, Pages 19-22

Low energy electron beam for time-of-flight ionization measurements

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; IMPACT IONIZATION; MOLECULAR BEAMS; PARTICLE DETECTORS; VACUUM TECHNOLOGY;

EID: 3242886528     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(98)00204-8     Document Type: Article
Times cited : (3)

References (8)
  • 1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.