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Volumn 7, Issue 1-2, 2004, Pages 69-75
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Structure, optical and DC conduction mechanism of amorphous GaSe thin films
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Author keywords
DC conductivity; Density of states; GaSe thin films; Mott parameters; SCLC
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Indexed keywords
AMORPHOUS MATERIALS;
AUGER ELECTRON SPECTROSCOPY;
ELECTRIC CONDUCTANCE;
EVAPORATION;
SURFACE ROUGHNESS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
VACUUM;
X RAY DIFFRACTION ANALYSIS;
DC CONDUCTIVITY;
DENSITY OF STATES;
GASE THIN FILMS;
MOTT PARAMETERS;
SCLC;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 3242880786
PISSN: 13698001
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mssp.2004.05.004 Document Type: Article |
Times cited : (6)
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References (30)
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