-
1
-
-
0001746047
-
-
Bobrik, M. A., Laskowski, E. J., Johnson, R. W., Gillum, W. O., Berg, J. M., Hodgson, K. O. & Holm, R. H. (1978). Inorg. Chem. 17, 1402-1410.
-
(1978)
Inorg. Chem.
, vol.17
, pp. 1402-1410
-
-
Bobrik, M.A.1
Laskowski, E.J.2
Johnson, R.W.3
Gillum, W.O.4
Berg, J.M.5
Hodgson, K.O.6
Holm, R.H.7
-
2
-
-
0000145516
-
-
Carney, M. J., Papaefthymiou, G. C., Whitener, M. A., Spartalian, K., Frankel, R. B. & Holm, R. H. (1988). Inorg. Chem. 27, 346-352.
-
(1988)
Inorg. Chem.
, vol.27
, pp. 346-352
-
-
Carney, M.J.1
Papaefthymiou, G.C.2
Whitener, M.A.3
Spartalian, K.4
Frankel, R.B.5
Holm, R.H.6
-
3
-
-
10544234069
-
-
Ciurli, S., Yu, S.-B. & Holm, R. H. (1990). J. Am. Chem. Soc. 112, 8169-8171.
-
(1990)
J. Am. Chem. Soc.
, vol.112
, pp. 8169-8171
-
-
Ciurli, S.1
Yu, S.-B.2
Holm, R.H.3
-
5
-
-
0001186679
-
-
Harris, S. (1989). Polyhedron, 8, 2843-2882.
-
(1989)
Polyhedron
, vol.8
, pp. 2843-2882
-
-
Harris, S.1
-
6
-
-
0642349058
-
-
Henkel, G., Simon, W. & Krebs, B. (1989). Z. Kristallogr. 186, 125-127.
-
(1989)
Z. Kristallogr.
, vol.186
, pp. 125-127
-
-
Henkel, G.1
Simon, W.2
Krebs, B.3
-
8
-
-
0002617994
-
-
Holm, R. H., Ciurli, S. & Weigel, J. A. (1990). Prog. Inorg. Chem. 38, 1-74.
-
(1990)
Prog. Inorg. Chem.
, vol.38
, pp. 1-74
-
-
Holm, R.H.1
Ciurli, S.2
Weigel, J.A.3
-
9
-
-
0001765591
-
-
Krebs, B. & Henkel, G. (1991). Angew. Chem. 103, 785-804; Angew. Chem. Int. Ed. Engl. 30, 769-788.
-
(1991)
Angew. Chem.
, vol.103
, pp. 785-804
-
-
Krebs, B.1
Henkel, G.2
-
10
-
-
33748212541
-
-
Krebs, B. & Henkel, G. (1991). Angew. Chem. 103, 785-804; Angew. Chem. Int. Ed. Engl. 30, 769-788.
-
Angew. Chem. Int. Ed. Engl.
, vol.30
, pp. 769-788
-
-
-
13
-
-
5844398455
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1991a). P3. Data Collection Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1991)
P3. Data Collection Software
-
-
-
14
-
-
5844223525
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1991b). XDISK. Diffractometer Data Reduction Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1991)
XDISK. Diffractometer Data Reduction Software
-
-
-
15
-
-
0009527379
-
-
Yu, S.-B., Papaefthymiou, G. C. & Holm, R. H. (1991). Inorg. Chem. 30, 3476-3485.
-
(1991)
Inorg. Chem.
, vol.30
, pp. 3476-3485
-
-
Yu, S.-B.1
Papaefthymiou, G.C.2
Holm, R.H.3
|