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Volumn 55, Issue 2, 1999, Pages 192-194

Tris(tetraethylammonium) tetra-μ3-selenido-tetrakis[(thiophenolato-S)iron]

Author keywords

[No Author keywords available]

Indexed keywords


EID: 3242800060     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198012190     Document Type: Article
Times cited : (3)

References (15)
  • 5
    • 0001186679 scopus 로고
    • Harris, S. (1989). Polyhedron, 8, 2843-2882.
    • (1989) Polyhedron , vol.8 , pp. 2843-2882
    • Harris, S.1
  • 9
    • 0001765591 scopus 로고
    • Krebs, B. & Henkel, G. (1991). Angew. Chem. 103, 785-804; Angew. Chem. Int. Ed. Engl. 30, 769-788.
    • (1991) Angew. Chem. , vol.103 , pp. 785-804
    • Krebs, B.1    Henkel, G.2
  • 10
    • 33748212541 scopus 로고    scopus 로고
    • Krebs, B. & Henkel, G. (1991). Angew. Chem. 103, 785-804; Angew. Chem. Int. Ed. Engl. 30, 769-788.
    • Angew. Chem. Int. Ed. Engl. , vol.30 , pp. 769-788
  • 13
    • 5844398455 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1991a). P3. Data Collection Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) P3. Data Collection Software
  • 14
    • 5844223525 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1991b). XDISK. Diffractometer Data Reduction Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) XDISK. Diffractometer Data Reduction Software


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.