A comparison of elemental analysis techniques requiring no sample preparation: Scanning electron microscopy and laser induced breakdown spectroscopy

Journal of Analytical Atomic Spectrometry

Volumn 19, Issue 7, 2004, Pages 929-931

  Heuser, Darryl ^a   Walker, Dwight S ^a  

^a GLAXOSMITHKLINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACIDS; ELECTRIC EXCITATION; ELECTRIC POTENTIAL; EMISSION SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; LASER APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

ATOMIC EXCITATION; ELEMENTAL ANALYSIS; LASER INDUCED BREAKDOWN SPECTROSCOPY; OPTICAL EMISSION SPECTROSCOPIES (OES);

SCANNING ELECTRON MICROSCOPY;

EID: 3242782514     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/b400801d     Document Type: Conference Paper

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