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Volumn 19, Issue 3, 2004, Pages 1253-1258

Determination of transformer capacities in an industrial factory with intermittent loads

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC LOADS; ELECTRIC POTENTIAL; ELECTRIC POWER DISTRIBUTION; GENETIC ALGORITHMS; INDUSTRIAL PLANTS; LINEAR EQUATIONS; MARKOV PROCESSES; MATHEMATICAL MODELS;

EID: 3242772946     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2004.829949     Document Type: Article
Times cited : (11)

References (15)
  • 4
    • 0026838110 scopus 로고
    • A fast discrete method for voltage drop and current calculation for manufacturing facilities with intermittent loads
    • Mar./Apr
    • F.S. Prabhakara, "A fast discrete method for voltage drop and current calculation for manufacturing facilities with intermittent loads," IEEE Trans. Ind. Applicat., vol. 28, pp. 329-335, Mar./Apr. 1992.
    • (1992) IEEE Trans. Ind. Applicat., , vol.28 , pp. 329-335
    • Prabhakara, F.S.1
  • 5
    • 0026836047 scopus 로고
    • Current calculation methodology for manufacturing facilities with intermittent loads
    • Mar./Apr
    • F.S. Prabhakara, "Current calculation methodology for manufacturing facilities with intermittent loads," IEEE Trans. Ind. Applicat., vol. 28, p. 324-328, Mar./Apr. 1992.
    • (1992) IEEE Trans. Ind. Applicat. , vol.28 , pp. 324-328
    • Prabhakara, F.S.1
  • 6
    • 0026387212 scopus 로고
    • Frequency and duration of voltage drop in plants with intermittent loads
    • Dearborn, MI, Sept. 28-Oct. 4
    • F.S. Prabhakara, J.J. Miller, and W.E. Kazibwe, "Frequency and duration of voltage drop in plants with intermittent loads," in Proc. IEEE Ind. Applicat. Soc., Annu. Tech. Conf., Dearborn, MI, Sept. 28-Oct. 4 1991, pp. 1584-1590.
    • (1991) Proc. IEEE Ind. Applicat. Soc., Annu. Tech. Conf. , pp. 1584-1590
    • Prabhakara, F.S.1    Miller, J.J.2    Kazibwe, W.E.3
  • 8
    • 3242809633 scopus 로고
    • Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std. 493, the gold book
    • May
    • L.E. Conrad, "Proposed chapter 9 for predicting voltage sags (dips) in revision to IEEE Std. 493, the gold book," IEEE Trans. Ind. Applicat., vol. 30, pp. 791-880, May 1994.
    • (1994) IEEE Trans. Ind. Applicat. , vol.30 , pp. 791-880
    • Conrad, L.E.1
  • 9
    • 3242764470 scopus 로고    scopus 로고
    • Voltage Dips, Short Interruption and Voltage Variations Immunity Tests
    • 61000-4-11
    • Voltage Dips, Short Interruption and Voltage Variations Immunity Tests, IEC Std. 61000-4-11.
    • IEC Std.
  • 10
    • 0141640956 scopus 로고    scopus 로고
    • IEEE Recommended Practice for Evaluating Electric Power System Compatibility with Electronic Process Equipment
    • IEEE Recommended Practice for Evaluating Electric Power System Compatibility with Electronic Process Equipment, IEEE Std. 1346-1998.
    • IEEE Std. , pp. 1346-1998
  • 12
    • 0036505005 scopus 로고    scopus 로고
    • Genetic algorithm for supply restoration and optimal load shedding in power system distribution networks
    • Gen. Transm. Dist., Mar
    • W.P. Luan, M.R. Irving, and J.S. Daniel, "Genetic algorithm for supply restoration and optimal load shedding in power system distribution networks," Proc. Inst. Elect. Eng., Gen., Transm. Dist., vol. 149, no. 2, pp. 145-151, Mar. 2002.
    • (2002) Proc. Inst. Elect. Eng. , vol.149 , Issue.2 , pp. 145-151
    • Luan, W.P.1    Irving, M.R.2    Daniel, J.S.3
  • 13
    • 0036474326 scopus 로고    scopus 로고
    • Unit commitment solution methodology using genetic algorithm
    • Feb
    • K.S. Swarup and S. Yamashiro, "Unit commitment solution methodology using genetic algorithm," IEEE Trans. Power Syst., vol. 17, pp. 87-91, Feb. 2002.
    • (2002) IEEE Trans. Power Syst. , vol.17 , pp. 87-91
    • Swarup, K.S.1    Yamashiro, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.