Charge ordering in Eu3S4 determined by the valence-difference contrast of synchrotron X-ray diffraction

Physica B: Condensed Matter

Volumn 350, Issue 4-3, 2004, Pages 353-365

  Ohara, Hiroki ^a,c   Sasaki, Satoshi ^a   Konoike, Yukiko ^a,d   Toyoda, Takeshi ^a,e   Yamawaki, Kouji ^a   Tanaka, Masahiko ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c SEMICONDUCTOR ENERGY LABORATORY CO LTD   (Japan)

^d FUJITSU LABORATORIES LTD   (Japan)

^e INDUSTRIAL RESEARCH INSTITUTE OF ISHIKAWA   (Japan)

Author keywords

Charge ordering; Eu3S4; Mixed valence compound; Synchrotron radiation; Valence contrast; X ray anomalous scattering

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; LEAST SQUARES APPROXIMATIONS; PHASE TRANSITIONS; RAMAN SCATTERING; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

CHARGE ORDERING; EU3S4; MIXED-VALENCE COMPOUND; VALENCE CONTRAST; X-RAY ANOMALOUS SCATTERING;

EUROPIUM COMPOUNDS;

EID: 3242712062     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.04.072     Document Type: Article

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