Turbidimetric measurement for on-line monitoring of SiO2 particles

Bulletin of the Korean Chemical Society

Volumn 25, Issue 6, 2004, Pages 801-805

  Kim, In Sook ^a   Kim, Yangsun ^b   Lim, H B ^a  

^a Dankook University   (South Korea)

^b Proteonik Inc   (South Korea)

Author keywords

On line monitoring; SiO2 particle; Turbidimetry

Indexed keywords

SILICON DIOXIDE;

ARTICLE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MEASUREMENT; MONITORING; ONLINE ANALYSIS; PARTICLE SIZE; TURBIDIMETRY;

EID: 3242711620     PISSN: 02532964     EISSN: None     Source Type: Journal    
DOI: 10.5012/bkcs.2004.25.6.801     Document Type: Article

References (15)

1. Hatukai, S.; Ben-Tzur, Y.; Rebhun, M. Water Science and Technology 1997, 36(4), 225.
2. Volten, H.; De Haan, J. F.; Vassen, W.; Lumme, K.; Hovenier, J. W. J. Aerosol Sci. 1996, 27, s527.
3. Raphael, M.; Rohani, S. Powder Technology 1996, 89, 157.
4. Irache, J. M.; Durrer, C.; Ponchel, G.; Duchene, D. International Journal of Pharmaceutics 1993, 90(3), R9.
5. Harris, G. W. Powder Technology 1970, 3(1), 107.
6. Bhargava, D. S.; Mariam, D. W. ISPRS Journal of Photogrammetry and Remote Sensing 1991, 46(4), 217.
7. Gregory, J. Filtration & Separation 1998, Jan/Feb, 63.
8. Depasse, J. Journal of Colloid and Interface Science 1997, 188, 229.
9. Weiss, A.; Horner, K. D.; Ballauff, M. Journal of Colloid and Interface Science 1999, 213, 417.
10. Gossen, P. D.; MacGreger, J. F. Journal of Colloid and Interface Science 1993, 160(1), 24.
11. Crawley, G.; Courni, M.; Di Benedetto, D. Powder Technology 1997, 91, 197.
12. Elicabe, G.; Frontini, G. Journal of Colloid and Interface Science 1996, 181, 669.
13. Hongve, D.; Akesson, G. Wat. Res. 1998, 32(10), 3143.
14. Lim, H. B.; Kim, T. H.; Eom, S. H.; Sung, Y.-i.; Moon, M. H.; Lee, D. W. J. Anal. Ato. Spectrom. 2002, 17, 109.
15. Jun, P. K.; Lim, H. B. J. Anal. At. Spectrom. 2003, 18, 111.