Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes

Applied Physics Letters

Volumn 85, Issue 1, 2004, Pages 112-114

  Nojeh, Alireza ^a   Wong, Wai Kin ^a,c   Baum, Aaron W ^a   Pease, R Fabian ^a   Dai, Hongjie ^b  

^a Stanford University   (United States)

^b STANFORD UNIVERSITY   (United States)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DETECTORS; ELECTRON EMITTERS; SINGLE-WALLED CARBON NANOTUBES (SWCNT);

CHEMICAL VAPOR DEPOSITION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON GUNS; IMAGE ANALYSIS; SCANNING ELECTRON MICROSCOPY; STRENGTH OF MATERIALS;

CARBON NANOTUBES;

EID: 3242686310     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1763984     Document Type: Article

References (3)

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2. O. J. Lee and K. H. Lee, Appl. Phys. Lett. 82, 3770 (2003).
3. J. Cumings, A. Zettl, M. R. McCartney, and J. C. H. Spence, Phys. Rev. Lett. 88, 056804 (2002).