Preparation, structure and dielectric properties of Ba 4LaMNb3O15 (M = Ti, Sn ) ceramics

Materials Research Bulletin

Volumn 39, Issue 11, 2004, Pages 1649-1654

  Fang, Liang ^a,b   Zhang, Hui ^a,b   Huang, T H ^a   Yuan, R Z ^a   Dronskowski, Richard ^b  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

A. Electronic materials; C. X ray diffraction; D. Dielectric properties

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC MATERIALS; MICROWAVES; MOLECULAR STRUCTURE; NATURAL FREQUENCIES; PERMITTIVITY; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

ELECTRONIC MATERIALS; REACTION ROUTES; TEMPERATURE COEFFICIENT; TEMPERATURE VARIATION;

BARIUM COMPOUNDS;

EID: 3242684168     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2004.05.015     Document Type: Article

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