Ultrasmall, small, and wide angle X-ray scattering analysis of diatom biosilica: Interspecific differences in fractal properties

Journal of Materials Chemistry

Volumn 14, Issue 13, 2004, Pages 1970-1975

  Vrieling, Engel G ^a   Beelen, Theo P M ^b   Sun, Qianyao ^b   Hazelaar, Sandra ^a   Van Santen, Rutger A ^b   Gieskes, Winfried W C ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; PORE SIZE; X RAY SCATTERING;

BIOSILICA; SILICA-BASED MATERIAL;

SILICA;

SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; PHASE TRANSITION; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; X RAY ANALYSIS;

EID: 3242677782     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b400478g     Document Type: Article

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