Extraction of emission area from Fowler-Nordheim plots

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 3, 2004, Pages 1222-1226

  Forbes, Richard G ^a   Deane, Jonathan H B ^a   Hamid, Nabil ^a   Sim, Hwa San ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURVE FITTING; ELECTRON TUNNELING; ERROR ANALYSIS; ITERATIVE METHODS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; REGRESSION ANALYSIS;

BARRIER MODELS; COORDINATES; FREE-ELECTRON THEORY; VARIABLES;

ELECTRON EMISSION;

EID: 3242668948     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1691410     Document Type: Conference Paper

References (9)

1. R. G. Forbes and K. L. Jensen, Ultramicroscopy 89, 17 (2001).
2. R. G. Forbes, J. Vac. Sci. Technol. B 17, 534 (1999).
3. R. G. Forbes, J. Vac. Sci. Technol. B 17, 526 (1999).
4. E. L. Murphy and R. H. Good, Phys. Rev. 102, 1464 (1956).
5. M. Abramowitz and I. A. Stegun, Handbook of Mathematical Functions (Dover, New York, 1965).
6. R. G. Forbes, Surf. Interface Anal. (to be published).
7. H. J. Jeffreys, Proc. London Math. Soc. 23, 428 (1924).
8. H. S. Sim, BEng Project Report, University of Surrey, Department of Electronic Engineering, 2003.
9. N. Hamid, BEng Project Report, University of Surrey, Department of Electronic Engineering, 2003.