Debugging diagnosing scan chains

Electronic Device Failure Analysis

Volumn 7, Issue 1, 2005, Pages 16-24

  Crouch, Alfred L ^a,b  

^a Inovys Corporation   (United States)

^b IEEE

Author keywords

[No Author keywords available]

Indexed keywords

ATPG TOOLS; FUNCTIONAL LOGIC;

ALGORITHMS; COMPUTER AIDED SOFTWARE ENGINEERING; DATA REDUCTION; FORMAL LOGIC; VECTORS;

PROGRAM DEBUGGING;

EID: 32344433053     PISSN: 15370755     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)