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Volumn 61, Issue 6, 2006, Pages

Melaminium formate

Author keywords

[No Author keywords available]

Indexed keywords


EID: 32244446558     PISSN: 16005368     EISSN: None     Source Type: Journal    
DOI: 10.1107/S1600536805015151     Document Type: Article
Times cited : (10)

References (18)
  • 11
    • 32244433903 scopus 로고    scopus 로고
    • Kuma Diffraction, Wrocław, Poland
    • Kuma (2001). KM-4 CCD Software. Version 171. Kuma Diffraction, Wrocław, Poland.
    • (2001) KM-4 CCD Software. Version 171
  • 15
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wiconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wiconsin, USA.
    • (1990) SHELXTL
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.