Spectroscopic ellipsometry and photometry applied to color filter characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2873, Issue , 1996, Pages 184-187

  Defranoux, C ^a   Piel, J P ^a   Stehle, J L ^a  

^a SOPRA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

POLARIZATION;

COLOR FILTERS; OPTICAL INDICES; PIGMENT CONCENTRATION; PRECISE POSITIONING; SPATIAL RESOLUTION; STRUCTURAL INFORMATION; TRANSMITTANCE MEASUREMENTS; WAVELENGTH RANGES;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 32244434554     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.246214     Document Type: Conference Paper

References (0)