An evaluation of a scanning mobility particles sizer with NIST-traceable particle size standards

2005 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2005 Technical Proceedings

Volumn , Issue , 2005, Pages 691-694

  Vasiliou, J ^a  

^a Duke Scientific Corp   (United States)

Author keywords

Nist; Particle; Size; Smps; Standard

Indexed keywords

LIGHT SCATTERING; POLYSTYRENES; SCANNING; SPRAYING;

NIST; PARTICLE; SIZE; SMPS;

PARTICLE SIZE ANALYSIS;

EID: 32144456416     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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