Early, accurate dependability analysis of CAN-based networked systems

IEEE Design and Test of Computers

Volumn 23, Issue 1, 2006, Pages 38-45

  Pérez Acle, Julio ^a   Sonza Reorda, Matteo ^b   Violante, Massimo ^b  

^a UNIVERSIDAD DE LA REPÚBLICA   (Uruguay)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; COMPUTER SYSTEMS; INTERFACES (COMPUTER); SYSTEMS ANALYSIS;

COMPUTER-BASED SYSTEMS; CONTROLLER AREA NETWORK (CAN) PROTOCOL; NETWORKED SYSTEMS; SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEM DESIGN (SBCCI);

NETWORK PROTOCOLS;

EID: 32144449231     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.10     Document Type: Article

References (8)

1. R.K. Iyer and D. Tang, "Experimental Analysis of Computer System Dependability," Fault-Tolerant Computer System Design, D.K. Pradhan, ed., Prentice Hall, 1996, pp. 282-392.
2. D.D. Gajski and F. Vahid, "Specification and Design of Embedded Hardware-Software Systems," IEEE Design & Test of Computers, vol. 12, no. 1, Spring 1995, pp. 53-67.
3. J. Pérez, M. Sonza Reorda, and M. Violante, "Dependability Analysis of CAN Networks: An Emulation-Based Approach," Proc. IEEE Int'l Symp. Defect and Fault Tolerance in VLSI Systems, IEEE CS Press, 2003, pp. 537-544.
4. P.E. Dodd and L.W. Massengill, "Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics," IEEE Trans. Nuclear Science, vol. 50, no. 3, June 2004, pp. 583-602.
5. F. Corno et al., "Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems," Proc. Int'l Test Conf., IEEE CS Press, 2004, pp. 1332-1339.
6. J. Pérez, M. Sonza Reorda, and M. Violante, "Accurate Dependability Analysis of CAN-Based Networked Systems," Proc. Symp. Integrated Circuits and Systems Design, IEEE Press, 2003, pp. 337-342.
7. P. Civera et al., "Exploiting Circuit Emulation for Fast Hardness Evaluation," IEEE Trans. Nuclear Science, vol. 48, no. 6, Dec. 2001, pp. 2210-2216.
8. F. Corno, P. Gabrielli, and S. Tosato, "System-Level Analysis of Fault Effects in an Automotive Environment," Proc. IEEE Int'l Symp. Defect and Fault Tolerance in VLSI Systems, IEEE CS Press, 2003, pp. 529-536.