Outage probability for maximal ratio combining of arbitrarily correlated faded signals corrupted by multiple Rayleigh interferers

IEEE Transactions on Vehicular Technology

Volumn 55, Issue 1, 2006, Pages 383-387

  Cui, X W ^a   Zhang, Q T ^b   Feng, Z M ^a  

^a TSINGHUA UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Correlated Nakagami fading; Correlated Rayleigh fading; Correlated Rician fadaing; Maximal ratio combining (MRC); Outage probability

Indexed keywords

CORRELATION METHODS; PROBABILITY DENSITY FUNCTION; RAYLEIGH FADING; SIGNAL INTERFERENCE; SIGNAL TO NOISE RATIO; VECTORS;

CORRELATED NAKAGAMI FADING; CORRELATED RAYLEIGH FADING; CORRELATED RICIAN FADING; MAXIMAL RATIO COMBINING (MRC); MULTIPLE RAYLEIGH INTERFERERS; OUTAGE PROBABILITY;

CELLULAR RADIO SYSTEMS;

EID: 32144439743     PISSN: 00189545     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVT.2005.861186     Document Type: Article

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