Frequency domain thickness measurement approach for microscale multilayered structures

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 1, 2006, Pages 206-211

  Li, Chen ^a   Cetinkaya, Cetin ^a  

^a Clarkson University   (United States)

Author keywords

Acoustic testing; Multilayered structures; Multilayers; Nondestructive testing; Thickness measurement; Transfer matrix formulation

Indexed keywords

ACOUSTIC EQUIPMENT; ALGORITHMS; ATTENUATION; BOUNDARY CONDITIONS; ELASTIC WAVES; FAST FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; LAPLACE TRANSFORMS; MULTILAYERS; NATURAL FREQUENCIES; THICKNESS MEASUREMENT; TRANSFER FUNCTIONS;

MULTILAYERED STRUCTURES; TRANSDUCER RESPONSE; TRANSFER MATRIX FORMULATION;

WAVE PROPAGATION;

EID: 32044458415     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.860866     Document Type: Article

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