Reliability concerns in embedded system designs

Computer

Volumn 39, Issue 1, 2006, Pages 118-120

  Narayanan, Vijaykrishnan ^a   Xie, Yuan ^a  

^a The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DATA STORAGE EQUIPMENT; DESIGN FOR TESTABILITY; ELECTROMIGRATION; HOT CARRIERS; MULTIPROCESSING SYSTEMS; RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE;

ACCELERATED AGING EFFECT; EMBEDDED SYSTEM DESIGN; PROCESS VARIABILITY; TRANSIENT ERRORS;

EMBEDDED SYSTEMS;

EID: 32044442310     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MC.2006.31     Document Type: Article

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