Productive metrology-adding value to manufacture

CIRP Annals - Manufacturing Technology

Volumn 54, Issue 2, 2005, Pages 155-168

  Kunzmann, H ^a   Pfeifer, T ^b   Schmitt, R ^b   Schwenke, H ^b   Weckenmann, A ^c  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Deterministic Process Control; Information Technology; Production Metrology

Indexed keywords

COSTS; ECONOMIC AND SOCIAL EFFECTS; INDUSTRIAL ECONOMICS; INFORMATION TECHNOLOGY; INFORMATION THEORY; PRODUCTION ENGINEERING;

DETERMINISTIC PROCESS CONTROL; METROLOGY COSTS; PRODUCTION ENGINEERS; PRODUCTION METROLOGY;

MEASUREMENT THEORY;

EID: 32044441852     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0007-8506(07)60024-9     Document Type: Article

References (32)

1. nd Edition, International Organization of Standardization (ISO), Geneva.
2. Shannon, C. E., Weaver, W., 1949, The Mathematical Theory of Communication, University of Illinois Press, Urbana.
3. Shannon, C. E., 1948, A Mathematical Theory of Communication, The Bell System Technical Journal, 27/379-423, 623-656, (Reprint with corrections on http://cm.bell-labs.com).
4. Umstätter, W., 1992, Die Skalierung von Information, Wissen und Literatur, Nachr. f. Dok. 43 (4) 227-242.
5. Drucker, P. F., 1989, The New Realities, Harper & Roe.
6. Drucker, P. F., 2001, The Essential Drucker, Butterworth-Heinemann.
7. Nonaka, I., Takeuchi, H., 1995, The Knowledge Creating Company, New York/Oxford: Oxford University Press.
8. Pfeifer, T., 1998, Fertigungsmesstechnik, Oldenbourg Verlag, München-Wien.
9. Dance, D. L., 1996, Cost of Ownership for Metrology Tools, American Institute of Physics.
10. Sawodny, O.; Goch, G.: (1997) Design of post process quality-control loop for the turning process. Proceedings of the IFAC Workshop on Manufacturing Systems "IFAC-MIM 97: Modelling, Management and Control", Wien, S. 279-284.
11. Ament, C: Direkte Regelung der Werkstückqualität in der Fertigung - Konzepte für ein neues Paradigma. Habilitation Thesis, University of Bremen, 2005.
12. th International Metrology Congress, October 1999, Bordeaux, France.
13. ISO 14253-1: Geometrical Product Specifications (GPS) - Inspection by measurement of workpieces and measuring equipment - Part 1 : Decision rules for proving conformance or non-conformance with specifications ISO 1998.
14. th IMEKO World Congress, June 2003, Dubrovnik, Croatia.
15. Peters, J., 1977, Metrology in Design and Manufacturing - Facts and Trends, Annals of the CIRP, 26/2:415-421.
16. Lazar, J. W., Bach, R. L., 1976, The National Measurement System for Length and Related Dimensional Measurements, Part I, U.S. Dept of Commerce, National Bureau of Standards (now NIST), NBSIR-75-926.
17. Trumpold, H., 1973, Measuring Techniques in Quality Control, 7 IMEKO Budapest, Hungary.
18. Williams, G., 2002, An assessment of the economic role of measurement and testing in modern society, Report for the European Commission, DG-Research.
19. Quinn T.J. : 1993, BIPM Rapport-94/5
20. Don Vito P.A. : 1984, Estimates of the cost of measurement in the US economy, Planning Report No. 21, NBS, US Dept. Of Commerce, Nov.1984
21. Clapham P.B. : 1992, Measurement for what is it worth, Engineering Science and Education Journal, Aug. 1992, 173-179
22. Spencer, C., Williams, G., 2002, The scope and dimensions of measurement activity in Europe, EUWP12, European Measurement Project, Oxford, Pembroke College.
23. DTI NMS (prepared by S. Bowns - PA Consulting Group), 1999, Review of the Rationale for and Economic Benefit of the UK National Measurement System.
24. Swann, P., 1999, The Economics of Measurement, Report for Department of Trade and Industry, National Measurement System Policy Unit, p.64, (www.dti.gov.uk/tese/swann.pdf).
25. NN, SEMI, 1995, Cost of Ownership for Semiconductor Manufacturing Equipment Metrics, SEMI E35-95.
26. ASME, 2002, B89.7.3.1-2001 Guideline for Decision Rules: Considering Measurement Uncertainty in Determining Confirm to Specifications, ASME International Publications.
27. ISO/TC 213, 2002, ISO/TS 17450-2:2002, Geometrical product specifications (GPS) - General concepts - Part 2: Basic tenets, specifications, operators and uncertainties.
28. Estler, W. T., 1999, Measurement as Inference: Fundamental Ideas, Annals of the CIRP, 48/2:611.
29. GUM, 1995, Guide to the expression of uncertainty in measurement, International Organization of Standardization (ISO), Geneva.
30. QED Technologies, Asphere manufacturing line, http://qedmrf.com/pdf/ aspherestechsheet.pdf
31. Personnel communication Schneider, QED Technologies
32. Schindler, A., et al, 2002, lonenstrahl-finishing von Hochleistungsoptiken, Forum, OPTATEC 06/2002, Frankfurt/M, Germany.