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Volumn , Issue , 2004, Pages 1725-1735

Issues associated with probabilistic failure modeling of digital systems

Author keywords

Digital Systems; Probabilistic Risk Assessment; Safety Critical Systems

Indexed keywords

DIGITAL SYSTEMS; PROBABILISTIC RISK ASSESSMENT; SAFETY-CRITICAL SYSTEMS;

EID: 32044439600     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.