A (4×2) reconstruction of CuInSe2 (001) studied by low-energy electron diffraction and soft x-ray photoemission spectroscopy

Applied Physics Letters

Volumn 88, Issue 5, 2006, Pages 1-3

  Deniozou, Th ^a   Esser, N ^a   Schulmeyer, Th ^b   Hunger, R ^b  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; SELENIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

CORE-LEVEL BINDING ENERGY SHIFTS; DECAPPING PROCESS; SE CAPPING;

SEMICONDUCTOR MATERIALS;

EID: 31944433535     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2162677     Document Type: Article

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