On a control of photon-surface plasmon coupling at a multilayer diffraction grating

ASDAM 2000 - Conference Proceedings: 3rd International EuroConference on Advanced Semiconductor Devices and Microsystems

Volumn , Issue , 2000, Pages 445-448

  Dmitruk, N L ^a   Mayeva, O I ^a   Mamykin, S V ^a   Yastmbchak, O B ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; MICROSYSTEMS; MULTILAYERS; PHOTONS; PLASMONS; SEMICONDUCTOR DEVICES; SPECTROSCOPIC ELLIPSOMETRY;

MULTILAYER DIFFRACTION GRATINGS; OPTOCHEMICAL SENSORS; SURFACE PLASMON COUPLING;

DIFFRACTION GRATINGS;

EID: 31844456672     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASDAM.2000.889541     Document Type: Conference Paper

References (7)

1. N.L.Dmitruk, O.I.Mayeva, S.V.Mamykin, O.B.Yastrubchak, Pisma Zh. Tekh. Fiz. 23, 52, 1997.
2. H.E. de Bruiju, B.P.H.Kooymau, and J.Greve, Appl.Opt, 31,440, 1992.
3. T.Inagaki, J.P.Goudounet, and E.T.Arakawa, J. Opt. Soc. Am. B., 3, 992, 1986.
4. J.A.Woollam, WVASE32 analysis program, made by LOT-Oriel, Darmstadt.
5. D.Aspnes,J.Theeten, and F.Hottier, Phys Rev.B, 20, 3292, 1979.
6. D.Bruggeman, Ann.Phys.Leipzig 24, 636, 1935.
7. H.W.Verleur, J. Opt. Soc. Am., 58, 1356, 1968.