Submicron particle localization using evanescent field

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5930, Issue , 2005, Pages 1-9

  Šiler, Martin ^a   Šerý, Mojmír ^a   Čizmár, Tomás ^a   Zemánek, Pavel ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE INTERFERENCE; IMAGING TECHNIQUES; LIGHT REFLECTION; PARTICLES (PARTICULATE MATTER); POLYSTYRENES;

COLLOIDAL PARTICLES; INTERNAL REFLECTION; OPTICAL TRAPS;

COLLOIDS;

EID: 31844442233     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.615741     Document Type: Conference Paper

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