Issues in measuring the degree of technological specialisation with patent data

Scientometrics

Volumn 66, Issue 3, 2006, Pages 481-492

  Van Zeebroeck, Nicolas ^a   Van Pottelsberghe De La Potterie, Bruno ^a   Han, Wook ^a  

^a SOLVAY BRUSSELS SCHOOL OF ECONOMICS AND MANAGEMENT   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 31744441865     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11192-006-0035-y     Document Type: Article

References (22)

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