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Volumn 33, Issue 10, 1986, Pages 7069-7076
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Local atomic structure in thin films of silicon nitride and silicon diimide produced by remote plasma-enhanced chemical-vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 31744436718
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.33.7069 Document Type: Article |
Times cited : (310)
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References (25)
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