Thickness dependence, in situ measurements, and morphology of thermally controlled interdiffusion in polymer-C60 photovoltaic devices

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 16, 2004, Pages

  Drees, M ^a,c   Davis, R M ^b   Heflin, J R ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b State University   (United States)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

2 METHOXY 5 (2' ETHYLHEXYLOXY) 1,4 PHENYLENEVINYLENE; COPOLYMER; FULLERENE DERIVATIVE; UNCLASSIFIED DRUG; VINYL DERIVATIVE;

ARTICLE; DIFFUSION; ELECTRIC CONDUCTIVITY; FILM; GLASS TRANSITION TEMPERATURE; HEATING; MISCIBILITY; TEMPERATURE; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 31744434441     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.165320     Document Type: Article

References (15)

1. N. S. Sariciftci, L. Smilowitz, A. J. Heeger, and F. Wudl, Science 258, 1474 (1992).
2. S. E. Shaheen, C. J. Brabec, N. S. Sariciftci, F. Padinger, T. Fromherz, and J. C. Hummelen, Appl. Phys. Lett. 78, 841 (2001).
3. M. Granstrom, K. Petritsch, A. C. Arias, A. Lux, M. R. Andersson, and R. H. Friend, Nature (London) 395, 257 (1998).
4. G. Yu, J. Gao, J. C. Hummelen, F. Wudl, and A. J. Heeger, Science 270, 1789 (1995).
5. L. Chen, D. Godovsky, O. Inganäs, J. C. Hummelen, R. A. J. Janssens, M. Svensson, and M. R. Andersson, Adv. Mater. (Weinheim, Ger.) 12, 1367 (2000).
6. D. Vacar, E. S. Maniloff, D. W. McBranch, and A. J. Heeger, Phys. Rev. B 56, 4573 (1997).
7. J. J. M. Halls, K. Pichler, R. H. Friend, S. C. Moratti, and A. B. Holmes, Appl. Phys. Lett. 68, 3120 (1996).
8. A. Haugeneder, M. Neges, C. Kallinger, W. Spirkl, U. Lemmer, J. Feldmann, U. Scherf, E. Harth, A. Gügel, and K. Müllen, Phys. Rev. B 59, 15346 (1999).
9. M. Drees, K. Premaratne, W. Graupner, J. R. Heflin, R. M. Davis, D. Marciu, and M. Miller, Appl. Phys. Lett. 81, 4607 (2002).
10. N. S. Sariciftci, L. Smilowitz, A. J. Heeger, and F. Wudl, Synth. Met. 59, 333 (1993).
11. A. C. Arias, M. Granstrom, D. S. Thomas, K. Petrisch, and R. H. Friend, Phys. Rev. B 60, 1854 (1999).
12. G. Yu, J. Gao, J. C. Hummelen, F. Wudl, and A. J. Heeger, Science 270, 1789 (1995).
13. E. A. Katz, D. Faiman, S. M. Tuladhar, J. M. Kroon, M. M. Wienk, T. Fromherz, F. Padinger, C. J. Brabec, and N. S. Sariciftci, J. Appl. Phys. 90, 5343 (2001).
14. I. Riedel, J. Parisi, V. Dyakonov, L. Lutsen, D. Vanderzande, and J. C. Hummelen, Adv. Funct. Mater. 14, 38 (2004).
15. C. Y. Yang and A. J. Heeger, Synth. Met. 83, 85 (1996).