Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution

International Journal of Quality & Reliability Management

Volumn 19, Issue 7, 2002, Pages 812-824

  Tong, Lee Ing ^a   Chen, K S ^b   Chen, H T ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c Sing Kauo University   (Taiwan)

Author keywords

Component manufacture; Electronics; Exponential forecasting; Process planning; Product life cycle; Quality

Indexed keywords

EID: 31644449599     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710210434757     Document Type: Article

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