Discretization of the Fermi surface in thin films

Thin Solid Films

Volumn 500, Issue 1-2, 2006, Pages 341-346

  Balcerzak, T ^a  

^a UNIVERSITY OF LODZ   (Poland)

Author keywords

Copper; Density of states; Fermi surface; Thin films

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRONIC DENSITY OF STATES; FERMI SURFACE;

DISCRETIZATION; FERMI WAVEVECTOR;

THIN FILMS;

EID: 31644440703     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.11.043     Document Type: Article

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