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Volumn 18, Issue 7, 2001, Pages 762-770

A new process capability index for non-normal distributions

Author keywords

Measurement; Process efficiency

Indexed keywords


EID: 31644440459     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710110396076     Document Type: Review
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.