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Volumn 61, Issue 7, 2006, Pages 2279-2289

Adhesion forces of charged particles

Author keywords

Adhesion force; Particle; Polymer; Polymerization; Powder technology; Toner

Indexed keywords

ADHESION; ALUMINUM; ELECTRIC FIELDS; MICROELECTRODES; PARTICLE SIZE ANALYSIS; POLYMERIZATION; POLYMERS; SUBSTRATES; SURFACE PROPERTIES; VAN DER WAALS FORCES;

EID: 31644431580     PISSN: 00092509     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ces.2004.06.051     Document Type: Conference Paper
Times cited : (48)

References (21)
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  • 2
    • 0035334095 scopus 로고    scopus 로고
    • Adhesion measurements for electrostatic powder coatings using drop test rig and virtual oscilloscope
    • K. Dastoori, and B. Makin Adhesion measurements for electrostatic powder coatings using drop test rig and virtual oscilloscope Journal of Electrostatics 51-52 2001 509 514
    • (2001) Journal of Electrostatics , vol.51-52 , pp. 509-514
    • Dastoori, K.1    Makin, B.2
  • 3
    • 0035334740 scopus 로고    scopus 로고
    • Measurements of thickness and adhesive properties of electrostatic powder coatings for standard and modified powder coating guns
    • K. Dastoori, B. Makin, and J. Telford Measurements of thickness and adhesive properties of electrostatic powder coatings for standard and modified powder coating guns Journal of Electrostatics 51-52 2001 545 551
    • (2001) Journal of Electrostatics , vol.51-52 , pp. 545-551
    • Dastoori, K.1    Makin, B.2    Telford, J.3
  • 7
    • 0035335297 scopus 로고    scopus 로고
    • Paper documents via the electrostatic control of particles
    • D.A. Hays Paper documents via the electrostatic control of particles Journal of Electrostatics 51-52 2001 57 63
    • (2001) Journal of Electrostatics , vol.51-52 , pp. 57-63
    • Hays, D.A.1
  • 9
    • 0030182794 scopus 로고    scopus 로고
    • Measurement of van der Waals force of toner adhesion employing a linearly increasing electric field and determining the toner jumping voltage
    • Y. Hoshino, N. Kutsuwada, Y. Watanabe, and H. Izawa Measurement of van der Waals force of toner adhesion employing a linearly increasing electric field and determining the toner jumping voltage Particulate Science and Technology 14 1996 267 277
    • (1996) Particulate Science and Technology , vol.14 , pp. 267-277
    • Hoshino, Y.1    Kutsuwada, N.2    Watanabe, Y.3    Izawa, H.4
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    • The effects of charge, size, and shape on toner photoconductor adhesion in electrophotographic systems
    • C.J. Mastrangelo The effects of charge, size, and shape on toner photoconductor adhesion in electrophotographic systems Photographic Science and Engineering 26 1982 194 197
    • (1982) Photographic Science and Engineering , vol.26 , pp. 194-197
    • Mastrangelo, C.J.1
  • 13
    • 31644449243 scopus 로고    scopus 로고
    • Measurement of adhesive force between solid surface and particle by AFM
    • Japan in Japanese
    • Mizuguchi, Y., Miyamoto, T., 2001. Measurement of adhesive force between solid surface and particle by AFM. Proceedings of Japan Hardcopy 2001, Japan, pp. 8-11 (in Japanese).
    • (2001) Proceedings of Japan Hardcopy 2001 , pp. 8-11
    • Mizuguchi, Y.1    Miyamoto, T.2
  • 15
    • 0028482711 scopus 로고
    • Atomic force microscopy adhesion measurements of surface-modified toners for xerographic applications
    • M.L. Ott, and H.A. Mizes Atomic force microscopy adhesion measurements of surface-modified toners for xerographic applications Colloids and Surfaces 87 1994 245 256
    • (1994) Colloids and Surfaces , vol.87 , pp. 245-256
    • Ott, M.L.1    Mizes, H.A.2
  • 19
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    • The development of the adhesion force measurement apparatus for individual particle based on electric field method
    • H. Uchida, T. Wada, and M. Takeuchi The development of the adhesion force measurement apparatus for individual particle based on electric field method Journal of Institute of Electrostatics, Japan 27 2003 194 198 (in Japanese)
    • (2003) Journal of Institute of Electrostatics, Japan , vol.27 , pp. 194-198
    • Uchida, H.1    Wada, T.2    Takeuchi, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.