Defect evaluation of spherical silicon solar cells fabricated by dropping method

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 11, 2005, Pages 7805-7808

  Okamoto, Chikao ^a   Minemoto, Takashi ^a   Murozono, Mikio ^b   Takakura, Hideyuki ^a   Hamakawa, Yoshihiro ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b Clean Venture 21 Co   (Japan)

Author keywords

Crystal defects; Dropping method; EBIC; Spherical Si solar cell; TEM

Indexed keywords

CRYSTAL DEFECTS; ELECTRON BEAMS; GRAIN BOUNDARIES; INDUCED CURRENTS; POLYSILICON;

DROPPING METHOD; EBIC; SPHERICAL SI SOLAR CELLS;

SILICON SOLAR CELLS;

EID: 31544480608     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.7805     Document Type: Article

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