Signal amplitude and sensitivity of the Kelvin probe force microscopy

Applied Physics Letters

Volumn 88, Issue 4, 2006, Pages 1-3

  Ouisse, T ^a   Martins, F ^a   Stark, M ^a   Huant, S ^a   Chevrier, J ^b,c  

^a UNIV GRENOBLE ALPES   (France)

^b CNRS   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ELECTRIC POTENTIAL; FREQUENCIES; OSCILLATIONS; PARAMETER ESTIMATION;

KELVIN PROBE FORCE MICROSCOPY; PARAMETRIC AMPLIFICATION;

SENSITIVITY ANALYSIS;

EID: 31544479843     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2168251     Document Type: Article

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