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Volumn 419, Issue 1-3, 2006, Pages 115-119
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Organic thin-film transistors with submicrometer channel length fabricated by atomic force microscopy lithography
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARRIER MOBILITY;
ELECTRIC CURRENTS;
ELECTRIC FIELDS;
LITHOGRAPHY;
ATOMIC FORCE MICROSCOPY LITHOGRAPHY;
CURRENT SATURATION;
ORGANIC THIN-FILM TRANSISTORS (OTFT);
SUBMICROMETER CHANNEL LENGTH;
THIN FILM TRANSISTORS;
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EID: 31544477414
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2005.11.056 Document Type: Article |
Times cited : (10)
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References (23)
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