Single cylinder in situ scanning electron microscope fatigue system

Review of Scientific Instruments

Volumn 77, Issue 1, 2006, Pages 1-4

  Smiltneek, Larry ^a   Shinde, Sachin R ^a   Hoeppner, David W ^a  

^a University of Utah   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK NUCLEATION; FATIGUE CYCLING; NODE CONTROL MECHANISM;

CRACKS; MICROSTRUCTURE; NUCLEATION; SCANNING ELECTRON MICROSCOPY; STRENGTH OF MATERIALS;

FATIGUE OF MATERIALS;

EID: 31544450025     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2163809     Document Type: Article

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