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Volumn 29, Issue 2, 2006, Pages 307-312

Compact-like kink in a real electrical reaction-diffusion chain

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; FAILURE ANALYSIS; FINITE ELEMENT METHOD; REACTION KINETICS; SPATIAL VARIABLES MEASUREMENT; THEOREM PROVING; VELOCITY;

EID: 31444453152     PISSN: 09600779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chaos.2005.08.212     Document Type: Article
Times cited : (16)

References (16)
  • 13
    • 0023362335 scopus 로고
    • SIAM (Soc Ind App Math)
    • J.P. Keener SIAM (Soc Ind App Math) J Appl Math 47 1987 556
    • (1987) J Appl Math , vol.47 , pp. 556
    • Keener, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.