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Volumn 86, Issue 3-5, 2006, Pages 317-322

Czochralski growth and X-ray topographic characterization of decagonal AlCoNi quasicrystals

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL GROWTH FROM MELT; CRYSTAL ORIENTATION; DEFECTS; LATTICE CONSTANTS; SINGLE CRYSTALS; X RAY ANALYSIS;

EID: 31444446020     PISSN: 14786435     EISSN: 14606992     Source Type: Journal    
DOI: 10.1080/14786430500253927     Document Type: Conference Paper
Times cited : (19)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.