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Volumn 86, Issue 3-5, 2006, Pages 317-322
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Czochralski growth and X-ray topographic characterization of decagonal AlCoNi quasicrystals
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COMPOUNDS;
CRYSTAL GROWTH FROM MELT;
CRYSTAL ORIENTATION;
DEFECTS;
LATTICE CONSTANTS;
SINGLE CRYSTALS;
X RAY ANALYSIS;
DEFECT SPREADING;
SYNCHROTRON SOURCES;
TOPOGRAPHIC CONSTANTS;
QUASICRYSTALS;
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EID: 31444446020
PISSN: 14786435
EISSN: 14606992
Source Type: Journal
DOI: 10.1080/14786430500253927 Document Type: Conference Paper |
Times cited : (19)
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References (9)
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