Backscattering of 8-28 keV electrons from a thick Al, Ti, Ag and Pt targets

Journal of Electron Spectroscopy and Related Phenomena

Volumn 151, Issue 1, 2006, Pages 71-77

  Yadav, R K ^a   Shanker, R ^a  

^a BANARAS HINDU UNIVERSITY   (India)

Author keywords

Backscattering coefficient; Diffusion range; Mean fractional energy absorbed; Penetration depth

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; ELECTRONS; SILVER; TITANIUM;

BACKSCATTERING COEFFICIENTS; DIFFUSION RANGE; MEAN FRACTIONAL ENERGY ABSORBED; PENETRATION DEPTH;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 31444440890     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.11.002     Document Type: Article

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