Analysis of arbitrary defects in photonic crystals by use of the source-model technique

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 21, Issue 7, 2004, Pages 1334-1343

  Ludwig, Alon ^a   Leviatan, Yehuda ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; CURRENT DENSITY; ELECTRIC CURRENT DISTRIBUTION; ELECTROMAGNETIC FIELDS; ENERGY GAP; ERROR ANALYSIS; MATHEMATICAL MODELS; OPTICAL WAVEGUIDES; PERTURBATION TECHNIQUES; PROBLEM SOLVING; VECTORS;

AUXILIARY UNPERTURBED PROBLEM; PERTURBED PROBLEM; PHOTONIC CRYSTALS; POWER FLOW DENSITY; SOURCE MODEL TECHNIQUE;

LIGHT SCATTERING;

EID: 3142775557     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.21.001334     Document Type: Article

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