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Volumn 201, Issue 8, 2004, Pages 1810-1814
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Post-annealing effect of YIG ferrite thin-films epitaxially grown by reactive sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTALLIZATION;
EPITAXIAL GROWTH;
FERRITE;
FINITE ELEMENT METHOD;
MAGNETIC ANISOTROPY;
MAGNETIC DEVICES;
MAGNETIC THIN FILMS;
MAGNETIZATION;
MAGNETRON SPUTTERING;
THERMAL EFFECTS;
THICKNESS CONTROL;
X RAY DIFFRACTION;
MICROWAVE MAGNETIC DEVICES;
POST-ANNEALING EFFECTS;
REACTIVE SPUTTERING;
YIG FERRITE THIN FILMS;
YTTRIUM COMPOUNDS;
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EID: 3142769898
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/pssa.200304515 Document Type: Conference Paper |
Times cited : (29)
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References (4)
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