Measurement of the third-order nonlinear optical coefficient of ZnO crystals by using ICCD-Z-scan

Chinese Physics Letters

Volumn 21, Issue 7, 2004, Pages 1356-1358

  Jia, Guang Ming ^a,b   Zhang, Gui Zhong ^a,b   Xiang, Wang Hua ^a,b   Ketterson, J B ^c  

^a TIANJIN UNIVERSITY   (China)

^b Key Lab Optoelectron Info/TS   (China)

^c NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; II-VI SEMICONDUCTORS; NONLINEAR OPTICS; SINGLE CRYSTALS;

BEAM-WAIST; IMAGE INTENSIFIED CHARGE COUPLED DEVICES; INTENSIFIED CHARGE COUPLED DEVICE DETECTOR; INTENSIFIED CHARGE COUPLED DEVICES; MEASUREMENTS OF; OXIDE CRYSTALS; SIMPLE++; THIRD ORDER NONLINEAR OPTICAL COEFFICIENT;

ZINC OXIDE;

EID: 3142754416     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/7/048     Document Type: Article

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