Photon band gap properties and omnidirectional reflectance in Si/SiO 2 Thue-Morse quasicrystals

Applied Physics Letters

Volumn 84, Issue 25, 2004, Pages 5186-5188

  Dal Negro, L ^a   Stolfi, M ^a   Yi, Y ^a   Michel, J ^a   Duan, X ^a   Kimerling, L C ^a   LeBlanc, J ^b   Haavisto, J ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b CHARLES STARK DRAPER LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OMNIDIRECTIONAL REFLECTANCE; OPTICAL BAND GAP; PHOTONIC DEVICES; TRASVERSE-MAGNETIC (TM) MODES;

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE REFLECTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED SPECTROMETERS; MAGNETRON SPUTTERING; MATRIX ALGEBRA; OPTICAL FILTERS; PHOTONS; REFRACTIVE INDEX; SENSORS; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

QUASICRYSTALS;

EID: 3142754077     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1764602     Document Type: Article

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