메뉴 건너뛰기




Volumn A, Issue , 2003, Pages 364-367

Interface formation between polycrystalline Cu(In,Ga)Se2 and II-VI-compounds

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; BAND ALIGNMENTS; DECAPPING; VALENCE BANDS;

EID: 3142747198     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (14)
  • 7
    • 0036721175 scopus 로고    scopus 로고
    • Preparation of a Si(111) Ga-Se van der Waals surface termination by selenization of a monolayer Ga on Si (111)
    • R. Fritsche, et al., "Preparation of a Si( 111 ) Ga-Se van der Waals Surface Termination by Selenization of a Monolayer Ga on Si ( 111 )", Surface Science. 515, 2-3 (2002)
    • (2002) Surface Science , vol.515 , pp. 2-3
    • Fritsche, R.1
  • 9
    • 6344230612 scopus 로고
    • Measurement of semiconductor heterojunction band discontinuities by x-ray photoemission spectroscopy
    • J.R. Waldrop, R.W. Grant, S.P. Kowalczyk, and E. A. Kraut, "Measurement of semiconductor heterojunction band discontinuities by x-ray photoemission spectroscopy", J.Vac.Sci.Technol. A. 3, 3 (1985)
    • (1985) J.Vac.Sci.Technol. A. , vol.3 , pp. 3
    • Waldrop, J.R.1    Grant, R.W.2    Kowalczyk, S.P.3    Kraut, E.A.4
  • 12
    • 79956043393 scopus 로고    scopus 로고
    • Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
    • J. Fritsche, T. Schulmeyer, D. Kraft, A. Thißen, A. Klein, and W. Jaegermann, "Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces", Appl. Phys. Lett. 81, 12 (2002)
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 12
    • Fritsche, J.1    Schulmeyer, T.2    Kraft, D.3    Thißen, A.4    Klein, A.5    Jaegermann, W.6
  • 14
    • 0032620403 scopus 로고    scopus 로고
    • 2 thin films during chemical-bath deposition process of CdS films
    • 2 thin films during chemical-bath deposition process of CdS films", Appl. Phys. Lett. 74, 17 (1999)
    • (1999) Appl. Phys. Lett. , vol.74 , pp. 17
    • Nakada, T.1    Kunioka, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.