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Volumn 28, Issue 13, 2004, Pages 84-87

Error analysis of discrete calculation method of flicker severity and its application

Author keywords

Discrete method; Error analysis; Flicker severity; Power system

Indexed keywords

ALGORITHMS; ELECTRIC CODES; ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; ERROR ANALYSIS; NUMERICAL ANALYSIS;

EID: 3142744637     PISSN: 10003673     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (13)

References (9)
  • 1
    • 0033313833 scopus 로고    scopus 로고
    • Models for predicting flicker induced by large wind turbines
    • Saad-Saoud Z, Jenkins N. Models for predicting flicker induced by large wind turbines[J]. IEEE Trans on Energy Conversion, 1999, 14(3); 743-748.
    • (1999) IEEE Trans on Energy Conversion , vol.14 , Issue.3 , pp. 743-748
    • Saad-Saoud, Z.1    Jenkins, N.2
  • 3
    • 2642587125 scopus 로고    scopus 로고
    • Study on voltage flicker measurement systems
    • Gao Shipai, Li Qunzhan, He Jianmin. Study on voltage flicker measurement systems[J]. Electric Power Automation Equipment, 2002, 22(5): 22-25.
    • (2002) Electric Power Automation Equipment , vol.22 , Issue.5 , pp. 22-25
    • Gao, S.1    Li, Q.2    He, J.3
  • 4
    • 3142736422 scopus 로고    scopus 로고
    • The digital realization of IEC's flickermeter
    • Liu Yazhou, Li Wei, Ji Yanchao et al. The digital realization of IEC's flickermeter[J]. Relay, 2000, 28(3): 18-21.
    • (2000) Relay , vol.28 , Issue.3 , pp. 18-21
    • Liu, Y.1    Li, W.2    Ji, Y.3
  • 5
    • 0035521162 scopus 로고    scopus 로고
    • Research of digital flickermeter based on IEC standard
    • Ma Yulong, Liu Lianguang, Zhang Jianhua et al. Research of digital flickermeter based on IEC standard[J]. Proceedings of the CSEE, 2001, 21(11): 92-95.
    • (2001) Proceedings of the CSEE , vol.21 , Issue.11 , pp. 92-95
    • Ma, Y.1    Liu, L.2    Zhang, J.3
  • 7
    • 3142710064 scopus 로고    scopus 로고
    • A study on calculation of short term flicker severity
    • Zhao Gang, Shi Wei, Lin Haixue. A study on calculation of short term flicker severity [J]. Power System Technology, 2001, 25(11): 15-18.
    • (2001) Power System Technology , vol.25 , Issue.11 , pp. 15-18
    • Zhao, G.1    Shi, W.2    Lin, H.3
  • 8
    • 3142666086 scopus 로고    scopus 로고
    • Chinese source
  • 9
    • 3142696888 scopus 로고    scopus 로고
    • Study on detecting method of voltage fluctuation in supply voltage
    • Tong Xiangqian, Yu Jianming. Study on detecting method of voltage fluctuation in supply voltage[J]. Chinese Journal of Scientific Instrument, 1998, 19(3): 234-238.
    • (1998) Chinese Journal of Scientific Instrument , vol.19 , Issue.3 , pp. 234-238
    • Tong, X.1    Yu, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.