Molecular dynamics simulation of stress induced grain boundary migration during nanoindentation experiments

Materials Science Forum

Volumn 449-452, Issue I, 2004, Pages 89-92

  Yoon, Jang Hyuk ^a   Kim, Seong Jin ^a   Jang, Ho ^a  

^a Korea University   (South Korea)

Author keywords

EAM potential; Grain boundary migration; Molecular dynamics simulation

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INDENTATION; MOLECULAR DYNAMICS; STACKING FAULTS; STRESS ANALYSIS;

EAM POTENTIAL; GRAIN BOUNDARY MIGRATIONS; MOLECULAR DYNAMICS SIMULATION;

NANOSTRUCTURED MATERIALS;

EID: 3142735984     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.449-452.89     Document Type: Conference Paper

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